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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer US
    Ebook
    Sofort lieferbar

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Unser bisheriger Preis:ORGPRICE: 224,43 €

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  2. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
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    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    Jose Pineda de Gyvez
    Springer US
    Ebook
    Sofort lieferbar

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    Unser bisheriger Preis:ORGPRICE: 111,03 €

    Jetzt 111,02 €Ebook
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  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    0 %
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US
    Buch
    Print on Demand

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Unser bisheriger Preis:ORGPRICE: 213,99 €

    Jetzt 213,97 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
  4. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    0 %
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US
    Taschenbuch
    Print on Demand

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Unser bisheriger Preis:ORGPRICE: 213,99 €

    Jetzt 197,92 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
  5. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    0 %
    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    José Pineda de Gyvez
    Springer US
    Taschenbuch
    Print on Demand

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    Unser bisheriger Preis:ORGPRICE: 139,09 €

    Jetzt 106,98 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
  6. Integrated Circuit Manufacturability
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    Integrated Circuit Manufacturability
    José Pineda de Gyvez
    Institute of Electrical & Electronics Engineers(IEEE)
    Buch
    Besorgungstitel - wird vorgemerkt

    Electrical Engineering Integrated Circuit Manufacturability The Art of Process and Design Integra...

    Unser bisheriger Preis:ORGPRICE: 265,50 €

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  7. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    0 %
    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    José Pineda de Gyvez
    Springer Nature Singapore
    Buch
    Besorgungstitel - wird vorgemerkt

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    Unser bisheriger Preis:ORGPRICE: 114,50 €

    Jetzt 106,98 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
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