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  1. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
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    Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    Ebook
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    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    Unser bisheriger Preis:ORGPRICE: 99,52 €

    Jetzt 99,51 €
  2. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Buch
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    The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functio...

    Unser bisheriger Preis:ORGPRICE: 235,39 €

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  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Ebook
    Sofort lieferbar

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

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