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  1. Design Automation for Timing-Driven Layout Synthesis
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    Moore's law [Noy77], which predicted that the number of devices in- tegrated on a chip would be d...

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  2. Modeling of Electrical Overstress in Integrated Circuits
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    Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant thre...

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  3. Hot-Carrier Reliability of MOS VLSI Circuits
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    As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

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  4. Physical Design for Multichip Modules
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    Physical Design for Multichip Modules collects togethera large body of important research work ...

    Unser bisheriger Preis:ORGPRICE: 161,42 €

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  5. Hot-Carrier Reliability of MOS VLSI Circuits
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    As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

    Unser bisheriger Preis:ORGPRICE: 213,99 €

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  6. Design Automation for Timing-Driven Layout Synthesis
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    Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 203,23 €Taschenbuch
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  7. Design Automation for Timing-Driven Layout Synthesis
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    Buch
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    Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 160,47 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
  8. Physical Design for Multichip Modules
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    Taschenbuch
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    Physical Design for Multichip Modules collects togethera large body of important resea...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 160,47 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
  9. Physical Design for Multichip Modules
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    Buch
    Print on Demand

    Physical Design for Multichip Modules collects togethera large body of important resea...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 160,47 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
  10. Modeling of Electrical Overstress in Integrated Circuits
    0 %
    Taschenbuch
    Print on Demand

    Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant thre...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 160,47 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
  11. Hot-Carrier Reliability of MOS VLSI Circuits
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    Taschenbuch
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    As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

    Unser bisheriger Preis:ORGPRICE: 277,13 €

    Jetzt 277,10 €Taschenbuch
    Alle Preise inkl. MwSt | Versandkostenfrei
  12. Modeling of Electrical Overstress in Integrated Circuits
    0 %
    Buch
    Print on Demand

    Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant thre...

    Unser bisheriger Preis:ORGPRICE: 203,25 €

    Jetzt 160,47 €Buch
    Alle Preise inkl. MwSt | Versandkostenfrei
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