Wavelet Analysis And Its Applications, And Active Media Technology - Proceedings Of The International Computer Congress 2004 (In 2 Volumes)

Wavelet analysis and its applications have been one of the fastest-growing research areas in the past several years. Wavelet theory has been employed in numerous fields and applications, such as signal and image processing, communication systems, biomedical imaging, radar, and air acoustics. Active media technology is concerned with the development of autonomous computational or physical entities capable of perceiving, reasoning, adapting, learning, cooperating, and delegating in a dynamic environment.This book captures the essence of the state of the art in wavelet analysis and its applications and active media technology. At the Congress, invited talks were delivered by distinguished researchers, namely Prof John Daugman of Cambridge University, UK; Prof Bruno Torresani of INRIA, France; Prof Victor Wickerhauser of Washington University, USA, Prof Ning Zhong of the Maebashi Institute of Technology, Japan; Prof John Yen of Pennsylvania State University, USA; and Prof Sankar K Pal of the Indian Statistical Institute, India.

Wavelet analysis and its applications have been one of the fastest-growing research areas in the past several years. Wavelet theory has been employed in numerous fields and applications, such as signal and image processing, communication systems, biomedical imaging, radar, and air acoustics. Active media technology is concerned with the development of autonomous computational or physical entities capable of perceiving, reasoning, adapting, learning, cooperating, and delegating in a dynamic environment.This book captures the essence of the state of the art in wavelet analysis and its applications and active media technology. At the Congress, invited talks were delivered by distinguished researchers, namely Prof John Daugman of Cambridge University, UK; Prof Bruno Torresani of INRIA, France; Prof Victor Wickerhauser of Washington University, USA, Prof Ning Zhong of the Maebashi Institute of Technology, Japan; Prof John Yen of Pennsylvania State University, USA; and Prof Sankar K Pal of the Indian Statistical Institute, India.