Applied Crystallography - Proceedings of the XVII International Conference

This proceedings volume contains research data on structural investigation of materials of high industrial value. In particular, the following issues are discussed: phase characterization by diffraction methods, application of direct methods for solving crystal structure from powder diffraction, electron crystallography, Rietveld method application, defects and substructure analysis in materials, new X-ray methods, small angle scattering studies of crystalline and amorphous solids, phase transformation studies including crystallography of the reversible martensitic transformation, structure of noncrystalline materials, structure and properties of new materials.

Dynamical diffraction by imperfect crystals, A. Authier; regularities of x-ray diffuse scattering in slightly distorted crystals containing precipitates, R.I. Barabash; temperature resolved x-ray diffractometry, A. Buchal; application of synchrotron radiation for powder diffraction, R.J. Cernik; single crystal structure determination on powders by electron crystallography, S. Hovmoller; quantitative phase analysis with the Rietveld method, R.J. Hill; x-ray analysis of dislocation-induced mosaicity in single crystals, P. Klimanek; small-angle scattering and alloy decomposition, G. Kostorz; laboratory x-ray and structure determination fromm powder diffraction data, D. Louer; the application of position-sensitive CCD detectorsin single crystal x-ray data collection, K. Ukaszewicz; mechanical properties of ceramic-based nanocomposite - role of intergranular structure, K. Niihara; determination of slip system in sapphire crystal by indentation, R. Nowak; structural determinations by means of electron diffraction and HREM, J. Pons; application of direct methods to low resolution powder data, J. Rius; application of small angle x-ray and neutron scattering in studies of the structure of disordered solids on length scales of about 5 to 10.00 A, P. Schmidt; XRD theatre of structure transformations in ferroelectric, HTSC, polytypre crystals, V. Shekhtman; on the non-crystallinity of opal, D.K. Smith; x-ray reflectivity in thin film studies, G. Stergioudis; paracrystalline distortions inherent strains and crystallite size in polymers, W. Wilke; structure and phase transformation of nano-scaled particles of alloys examined by electron diffraction and HREM, T. Tadaki. (Part contents).