X-Ray Diffraction by Disordered Lamellar Structures

X-Ray Diffraction by Disordered Lamellar Structures
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Theory and Applications to Microdivided Silicates and Carbons
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Artikel-Nr:
9783642748028
Veröffentl:
2012
Einband:
PDF
Seiten:
371
Autor:
Victor A. Drits
eBook Typ:
PDF
eBook Format:
PDF
Kopierschutz:
Adobe DRM [Hard-DRM]
Sprache:
Englisch
Beschreibung:

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

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