Bücher online kaufen
Minimum Error Entropy Classification
-0 %
HC runder Rücken kaschiert
Print on Demand | Lieferzeit: Print on Demand - Lieferbar innerhalb von 3-5 Werktagen I
Artikel-Nr:
9783642290282
Veröffentl:
2012
Einband:
HC runder Rücken kaschiert
Erscheinungsdatum:
25.07.2012
Seiten:
280
Autor:
Joaquim P. Marques de Sá
Gewicht:
588 g
Format:
241x160x20 mm
Serie:
420, Studies in Computational Intelligence
Sprache:
Englisch
Beschreibung:
Luís Silva, anthropologist, is Post-Doctoral research fellow at the Centre for Research in Anthropology, Universidade Nova de Lisboa (CRIA/FCSHUNL), Lisbon, Portugal. His principal research interests include rural dynamics and the anthropology of tourism, focusing specifically on the making of heritage and tourism products in rural areas, as well as on the local impact of tourism and the heritage enterprise.
This book explains the minimum error entropy (MEE) concept applied to data classification machines. Theoretical results on the inner workings of the MEE concept, in its application to solving a variety of classification problems, are presented in the wider realm of risk functionals.
Researchers and practitioners also find in the book a detailed presentation of practical data classifiers using MEE. These include multi-layer perceptrons, recurrent neural networks, complexvalued neural networks, modular neural networks, and decision trees. A clustering algorithm using a MEE-like concept is also presented. Examples, tests, evaluation experiments and comparison with similar machines using classic approaches, complement the descriptions.
This book explains the minimum error entropy (MEE) concept applied to data classification machines. Discusses theoretical results, offers a clustering algorithm using a MEE-like concept, and includes tests, evaluation experiments and comparative applications.
Presents data classification methodologies based on a minimum error entropy approach
Introduction.- Continuous Risk Functionals.- MEE with Continuous Errors.- MEE with Discrete Errors.- EE-Inspired Risks.- Applications.