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Applied Charged Particle Optics
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Artikel-Nr:
9783540719243
Veröffentl:
2007
Einband:
HC runder Rücken kaschiert
Erscheinungsdatum:
02.11.2007
Seiten:
144
Autor:
Helmut Liebl
Gewicht:
389 g
Format:
241x160x13 mm
Sprache:
Englisch
Beschreibung:
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. The book begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. The book's wide frame of reference makes this an ideal work for researchers, engineers and graduate students alike.
Lenses: Basic Optics.- Electrostatic Deflection.- Magnetic Deflection.- Image Aberrations.- Fringe Field Confinement.