Beschreibung:
An advanced level textbook covering geometric, chemical, and electronic structure of electronic materials, and their applications to devices based on semiconductor surfaces, metal-semiconductor interfaces, and semiconductor heterojunctions. Starting with the fundamentals of electrical measurements on semiconductor interfaces, it then describes the importance of controlling macroscopic electrical properties by atomic-scale techniques. Subsequent chapters present the wide range of surface and interface techniques available to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth with references to the most authoritative sources for more exhaustive discussions, while numerous examples are provided throughout to illustrate the applications of each technique. With its general reading lists, extensive citations to the text, and problem sets appended to all chapters, this is ideal for students of electrical engineering, physics and materials science. It equally serves as a reference for physicists, material science and electrical and electronic engineers involved in surface and interface science, semiconductor processing, and device modeling and design. This is a coproduction of Wiley and IEEE* Free solutions manual available for lecturers at wiley-vch.de/supplements/
Dieses Lehrbuch für Fortgeschrittene behandelt die geometrische, chemische und Elektronenstruktur elektronischer Materialien und ihre Anwendung auf Bauelemente mit Halbleiter-Grenzflächen, Metall-Halbleiter-Grenzflächen und Halbleiter-Heterokontakten. Ausgehend von der theoretischen und technischen Erläuterung üblicher Messverfahren wird ein breites Spektrum von Methoden zur Charakterisierung elektronischer, optischer, chemischer und struktureller Eigenschaften vorgestellt, die sich nicht nur für Halbleiter, sondern auch für Isolatoren, Nanostrukturen und organische Werkstoffe eignen. Großzügige Literaturhinweise erleichtern, wenn gewünscht, das tiefere Einarbeiten. Mit zahlreichen Beispielen und Übungsaufgaben!
Preface1. Introduction2. Historical Background3. Electrical Measurements4. Interface states5. Ultrahigh vacuum technology6. Surface and interface analysis7. Photoemission spectroscopy8. Photoemission with soft X-rays9. Particle-solid scattering10. Electron energy loss spectroscopy11. Rutherford backscattering spectrometry12. Secondary ion mass spectrometry13. Electron diffraction14. Scanning tunneling microscopy15. Optical spectroscopies16. Cathodoluminescence spectroscopy17. Electronic Materials' Surfaces18. Adsorbates on Electronic Materials' Surfaces19. Adsorbate-Semiconductor Sensors20. Heterojunctions21. Metals on semiconductors22. The future of interfacesAppendices