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Quantum Metrology, Imaging, and Communication
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Artikel-Nr:
9783319465494
Veröffentl:
2016
Einband:
HC runder Rücken kaschiert
Erscheinungsdatum:
08.12.2016
Seiten:
288
Autor:
David S. Simon
Gewicht:
600 g
Format:
241x160x22 mm
Serie:
Quantum Science and Technology
Sprache:
Englisch
Beschreibung:
David Simon. Professor, Stonehill College, Easton MA 02357, USA
Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA
Alexander V. Sergienko, Boston University, Boston MA 02215, USA
Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA
Alexander V. Sergienko, Boston University, Boston MA 02215, USA
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Ideal introduction to the basics and applications of quantum optics
Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.