Electrical Modeling and Design for 3D System Integration

Electrical Modeling and Design for 3D System Integration
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3D Integrated Circuits and Packaging, Signal Integrity, Power Integrity and EMC
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Artikel-Nr:
9781118166758
Veröffentl:
2012
Einband:
E-Book
Seiten:
384
Autor:
Er-Ping Li
eBook Typ:
PDF
eBook Format:
Reflowable E-Book
Kopierschutz:
Adobe DRM [Hard-DRM]
Sprache:
Englisch
Beschreibung:

New advanced modeling methods for simulating the electromagnetic properties of complex three-dimensional electronic systems Based on the author's extensive research, this book sets forth tested and proven electromagnetic modeling and simulation methods for analyzing signal and power integrity as well as electromagnetic interference in large complex electronic interconnects, multilayered package structures, integrated circuits, and printed circuit boards. Readers will discover the state of the technology in electronic package integration and printed circuit board simulation and modeling. In addition to popular full-wave electromagnetic computational methods, the book presents new, more sophisticated modeling methods, offering readers the most advanced tools for analyzing and designing large complex electronic structures. Electrical Modeling and Design for 3D System Integration begins with a comprehensive review of current modeling and simulation methods for signal integrity, power integrity, and electromagnetic compatibility. Next, the book guides readers through: The macromodeling technique used in the electrical and electromagnetic modeling and simulation of complex interconnects in three-dimensional integrated systems The semi-analytical scattering matrix method based on the N-body scattering theory for modeling of three-dimensional electronic package and multilayered printed circuit boards with multiple vias Two- and three-dimensional integral equation methods for the analysis of power distribution networks in three-dimensional package integrations The physics-based algorithm for extracting the equivalent circuit of a complex power distribution network in three-dimensional integrated systems and printed circuit boards An equivalent circuit model of through-silicon vias Metal-oxide-semiconductor capacitance effects of through-silicon vias Engineers, researchers, and students can turn to this book for the latest techniques and methods for the electrical modeling and design of electronic packaging, three-dimensional electronic integration, integrated circuits, and printed circuit boards.
New advanced modeling methods for simulating the electromagnetic properties of complex three-dimensional electronic systemsBased on the author's extensive research, this book sets forth tested and proven electromagnetic modeling and simulation methods for analyzing signal and power integrity as well as electromagnetic interference in large complex electronic interconnects, multilayered package structures, integrated circuits, and printed circuit boards. Readers will discover the state of the technology in electronic package integration and printed circuit board simulation and modeling. In addition to popular full-wave electromagnetic computational methods, the book presents new, more sophisticated modeling methods, offering readers the most advanced tools for analyzing and designing large complex electronic structures.Electrical Modeling and Design for 3D System Integration begins with a comprehensive review of current modeling and simulation methods for signal integrity, power integrity, and electromagnetic compatibility. Next, the book guides readers through:* The macromodeling technique used in the electrical and electromagnetic modeling and simulation of complex interconnects in three-dimensional integrated systems* The semi-analytical scattering matrix method based on the N-body scattering theory for modeling of three-dimensional electronic package and multilayered printed circuit boards with multiple vias* Two- and three-dimensional integral equation methods for the analysis of power distribution networks in three-dimensional package integrations* The physics-based algorithm for extracting the equivalent circuit of a complex power distribution network in three-dimensional integrated systems and printed circuit boards* An equivalent circuit model of through-silicon vias* Metal-oxide-semiconductor capacitance effects of through-silicon viasEngineers, researchers, and students can turn to this book for the latest techniques and methods for the electrical modeling and design of electronic packaging, three-dimensional electronic integration, integrated circuits, and printed circuit boards.
Foreword xiPreface xiii1. Introduction 11.1 Introduction of Electronic Package Integration, 11.2 Review of Modeling Technologies, 61.3 Organization of the Book, 102. Macromodeling of Complex Interconnects in 3D Integration 162.1 Introduction, 162.2 Network Parameters: Impedance, Admittance, and Scattering Matrices, 192.3 Rational Function Approximation with Partial Fractions, 252.4 Vector Fitting (VF) Method, 292.5 Macromodel Synthesis, 412.6 Stability, Causality, and Passivity of Macromodel, 482.7 Macromodeling Applied to High-Speed Interconnects and Circuits, 792.8 Conclusion, 913. 2.5D Simulation Method for 3D Integrated Systems 973.1 Introduction, 973.2 Multiple Scattering Method for Electronic Package Modeling with Open Boundary Problems, 983.3 Novel Boundary Modeling Method for Simulation of Finite-Domain Power-Ground Planes, 1273.4 Numerical Simulations for Finite Structures, 1333.5 Modeling of 3D Electronic Package Structure, 1423.6 Conclusion, 1824. Hybrid Integral Equation Modeling Methods for 3D Integration 1854.1 Introduction, 1854.2 2D Integral Equation Equivalent Circuit (IEEC) Method, 1864.3 3D Hybrid Integral Equation Method, 2204.4 Conclusion, 2385. Systematic Microwave Network Analysis for 3D Integrated Systems 2415.1 Intrinsic Via Circuit Model for Multiple Vias in an Irregular Plate Pair, 2425.2 Parallel Plane Pair Model, 2815.3 Cascaded Multiport Network Analysis of Multilayer Structure with Multiple Vias, 3056. Modeling of Through-Silicon Vias (TSV) in 3D Integration 3316.1 Introduction, 3316.2 Equivalent Circuit Model for TSV, 3366.3 MOS Capacitance Effect of TSV, 3516.4 Conclusion, 356References, 358Index 361

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