Modern RF and Microwave Measurement Techniques

Modern RF and Microwave Measurement       Techniques
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Artikel-Nr:
9781107036413
Veröffentl:
2018
Einband:
HC gerader Rücken kaschiert
Erscheinungsdatum:
14.12.2018
Seiten:
474
Autor:
Andrea Ferrero
Gewicht:
992 g
Format:
250x175x30 mm
Sprache:
Englisch
Beschreibung:

Valeria Teppati is a Researcher in the Millimeter Wave Electronics Group of the Department of Information Technology and Electrical Engineering at ETH Zurich, developing innovative solutions to aspects of linear and non-linear measurement techniques. Andrea Ferrero is a Professor in the RF, Microwave and Computational Electronics group of the Department of Electronics and Telecommunications at Politecnico di Torino. He is a Distinguished Microwave Lecturer of the IEEE Microwave Theory and Techniques Society, and a Fellow of the IEEE. Mohamed Sayed is the Principal Consultant for Microwave and Millimeter Wave Solutions and has nearly 30 years' experience of developing microwave and millimetre wave systems for Hewlett-Packard Co. and Agilent Technologies Inc.
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Part I. General Concepts: 1. Transmission lines and scattering parameters Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing, and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3. Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis and time-correlated measurements applied to non-linear system characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular systems for RF and microwave measurements Jin Bains; Part III. Linear Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9. Multiport and differential S-parameter measurements Valeria Teppati and Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF measurement Anthony Parker.

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