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Autor: Steven H. Voldman
ISBN-13: 9780470516164
Einband: E-Book
Seiten: 472
Sprache: Englisch
eBook Typ: PDF
eBook Format: E-Book
Kopierschutz: Adobe DRM [Hard-DRM]
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Latchup

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Interest in latchup is being renewed with the evolution ofcomplimentary metal-oxide semiconductor (CMOS) technology,metal-oxide-semiconductor field-effect transistor (MOSFET) scaling,and high-level system-on-chip (SOC) integration.
Clear methodologies that grant protection from latchup, withinsight into the physics, technology and circuit issues involved,are in increasing demand.

This book describes CMOS and BiCMOS semiconductor technology andtheir sensitivity to present day latchup phenomena, from basicover-voltage and over-current conditions, single event latchup(SEL) and cable discharge events (CDE), to latchup dominophenomena. It contains chapters focusing on bipolar physics,latchup theory, latchup and guard ring characterization structures,characterization testing, product level test systems, product leveltesting and experimental results. Discussions on state-of-the-artsemiconductor processes, design layout, and circuit level andsystem level latchup solutions are also included, as well as:
* latchup semiconductor process solutions for both CMOS toBiCMOS, such as shallow trench, deep trench, retrograde wells,connecting implants, sub-collectors, heavily-doped buriedlayers, and buried grids - from single- to triple-wellCMOS;
* practical latchup design methods, automated and bench-levellatchup testing methods and techniques, latchup theory of logarithmresistance space, generalized alpha (a) space, beta (b)space, new latchup design methods- connecting the theoreticalto the practical analysis, and;
* examples of latchup computer aided design (CAD)methodologies, from design rule checking (DRC) andlogical-to-physical design, to new latchup CAD methodologiesthat address latchup for internal and external latchup on a localas well as global design level.

Latchup acts as a companion text to the author'sseries of books on ESD (electrostatic discharge) protection,serving as an invaluable reference for the professionalsemiconductor chip and system-level ESD engineer. Semiconductordevice, process and circuit designers, and quality, reliability andfailure analysis engineers will find it informative on the issuesthat confront modern CMOS technology. Practitioners in theautomotive and aerospace industries will also find it useful. Inaddition, its academic treatment will appeal to both senior andgraduate students with interests in semiconductor process, devicephysics, computer aided design and design integration.

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Autor: Steven H. Voldman
ISBN-13 :: 9780470516164
ISBN: 047051616X
Verlag: John Wiley & Sons
Seiten: 472
Sprache: Englisch
Auflage 1. Auflage
Sonstiges: Ebook