Runs and Scans with Applications

Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * "e;Match"e; in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.

Expert practical and theoretical coverage of runs and scansThis volume presents both theoretical and applied aspects of runsand scans, and illustrates their important role in reliabilityanalysis through various applications from science and engineering.Runs and Scans with Applications presents new and exciting contentin a systematic and cohesive way in a single comprehensive volumecomplete with relevant approximations and explanations of somelimit theorems.The authors provide detailed discussions of both classical andcurrent problems, such as:* Sooner and later waiting time* Consecutive systems* Start-up demonstration testing in life-testing experiments* Learning and memory models* "Match" in genetic codesRuns and Scans with Applications offers broad coverage of thesubject in the context of reliability and life-testing settings andserves as an authoritative reference for students and professionalsalike.

List of Tables.List of Figures.Preface.Introduction and Historical Remarks.Waiting for the First Run Occurrence.Applications.Waiting for Multiple Run Occurrences.Number of Run Occurrences.Sooner/Later Run Occurrences.Multivariate Run-Related Distributions.Applications.Waiting for the First Scan.Waiting for Multiple Scans.Number of Scan Occurrences.Applications.Bibliography.Author Index.Subject Index.